ATPG PATTERN GENERATION USING TESSENT FOR

ATPG PATTERN GENERATION USING TESSENT FOR atpg The D-algorithm or other ATPG algorithms used for the rest Fault simulation is necessary in order to select useful patterns Weighted random patterns: 0 and 1 atpg ATPG 4 MI-R Order No Qty Continuous operating temp , min Continuous operating temp , max Wire connection cross section, finely stranded, max

atpg ATPG process , to refine the rules and to support readback of the test data for subsequent ATPG runs and diagnosis operations Figure presents this

atpg Typically, the staggered scheme produces small test sets but needs long ATPG runtime, whereas the one-hot scheme takes short ATPG runtime but yields large test ATPG LIMITED